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UKAEA-CCFE-PR(23)1272023
The high source stability and brightness of field emission gun equipped scanning electron microscopes (SEM) makes them ideal for high-resolution digital image correlation (HRDIC). However, their high initial capital cost can be prohibitive for research organisations and groups. Conventional thermionic SEMs using either a tungsten hairpin or LaB
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UKAEA-CCFE-PR(23)1262023
Scanning electron microscopy-based is now an established technique, providing full-field strain and displacement measurement at the microscale. Techniques for generating speckle patterns for sub-micron strain mapping are highly substrate dependent but typically rely on applying aggressive conditions which may alter the microstructure of interest…
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