Showing 1 - 2 of 2 UKAEA Paper Results
2023
UKAEA-CCFE-PR(23)127
B. Poole A. Marsh D. Lunt C. Hardie M. Gorley C. Hamelin A. Harte
The high source stability and brightness of field emission gun equipped scanning electron microscopes (SEM) makes them ideal for high-resolution digital image correlation (HRDIC). However, their high initial capital cost can be prohibitive for research organisations and groups. Conventional thermionic SEMs using either a tungsten hairpin or LaB
Preprint2023
UKAEA-CCFE-PR(23)126
B. Poole A. Marsh D. Lunt C. Hardie M. Gorley C. Hamelin A. Harte
Scanning electron microscopy-based is now an established technique, providing full-field strain and displacement measurement at the microscale. Techniques for generating speckle patterns for sub-micron strain mapping are highly substrate dependent but typically rely on applying aggressive conditions which may alter the microstructure of interest…
Preprint