UKAEA-CCFE-PR(25)299
2-Axis goniometer facility for x-ray characterisation of diffractors
Details of a 2-axis goniometer used with an x-ray source are presented, including measurements of double-crystal integrated reflectivity of diffractors used in spectrometers at JET. Polarization corrections of the measurements are calculated for estimates of the single-crystal integrated reflectivity. Synchronised parallel and dispersive diffractor motion profiles at this facility have good angular error distributions that involve all motors of $sim$2 arcsec over a complete range of the accessible Bragg angles (0 – 86 degrees).