Deconvolution of Thomson scattering (TS) profiles is required when the gradient length of the electron temperature ( T e ) or density ( n e ) are comparable to the instrument function length ( R ). The most correct method for deconvolution to obtain underlying T e and n e profiles is by consideration of scattered signals. However, deconvolution at the scattered signal level is complex since it requires knowledge of all spectral and absolute calibration data. In this paper a simple technique is presented where only knowledge of the instrument function I ( r ) and the measured profiles, T e, observed ( r ) and n e, observed ( r ), are required to obtain underlying T e ( r ) and n e ( r ). This method is appropriate for most TS systems and is particularly important where high spatial sampling is obtained relative to R .
