Vacuum ultraviolet, extreme ultraviolet, and x-ray line intensity normalization technique applied to tokamak plasmas

Vacuum ultraviolet, extreme ultraviolet, and x-ray line intensity normalization technique applied to tokamak plasmas

Vacuum ultraviolet, extreme ultraviolet, and x-ray line intensity normalization technique applied to tokamak plasmas 150 150 Mathew

Vacuum ultraviolet, extreme ultraviolet, and x-ray line intensity normalization technique applied to tokamak plasmas

An empirical procedure, ‘‘LINT,’’ for relating emission line intensities of intrinsic impurity ions to their elemental contributions to the total, bolometric, radiation loss and the volume-averaged effective ion charge, Zeff , has been developed and applied to limiter plasmas in the JET tokamak. In this article we discuss extensions to the data base to include x-ray lines and continua intensities, applicable to a wider range of tokamak plasma configurations such as X-point plasmas and quasi-steady-state, edge-cooled ELMy H modes. Examples are shown of the technique applied to reference discharges during which the plasma configuration is changed continuously. The total data set, comprising line and continua irradiances, tomographic bolometry, and x-ray emission and Zeff imposes constraints on the diffusion parameters used in models of impurity ion transport.

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01/01/1999